Advanced computing in electron microscopy

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This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.

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Title Statements

Full title :Advanced computing in electron microscopy / Earl J. Kirkland

Summary

Edition Statements

Publication Date:2020.
Edition:3rd ed

Publication Statements

Publisher(s):Springer
Place of Publication:Cham
Language:eng
Publication Date:2020.

The Physical Object

Description:1 online resource (xii, 357 pages) : : illustrations

Edition Identifiers

ISBN:9783030332600, 3030332608
DOI:10.1007/978-3-030-33260-0
oclc:on1145603587
LC Classification:QH212.E4
Dewey Decimal:570.28/25

Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.