Atomic force microscopy for energy research
by Shen, Cai
"Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial…
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- Full title :Atomic force microscopy for energy research / edited by Cai Shen.
Summary
"Atomic force microscopy (AFM) can be used to analyze and measure the physical properties of all kinds of materials at nanoscale in the atmosphere, liquid phase, and ultra-high vacuum environment. It has become an important tool for nanoscience research. In this book, the basic principles of functional AFM techniques and their applications in energy materials such as lithium batteries, electrochemical catalysis, solar cells, and other energy-related materials are addressed. With its substantial content and logical structure, Atomic Force Microscopy for Energy Research is a valuable reference for researchers in materials science, chemistry, and physics working with AFM or planning to use it in their own fields of research, especially energy research"--
Read More ↓Edition Statements
- Publication Date:©2022
- Edition:First edition
Publication Statements
- Publisher(s):CRC Press
- Place of Publication:Boca Raton, FL
- Language:eng
- Publication Date:©2022
The Physical Object
- Description:1 online resource (xiii, 441 pages) : : illustrations (chiefly color)
Edition Identifiers
- ISBN:9781000577877, 1000577872, 9781003174042, 1003174043, 9781000577921, 1000577929
- DOI:10.1201/9781003174042
- oclc:on1293917871
- LC Classification:QH212.A78
- Dewey Decimal:620/.5
Table of Contents
Principles and basic modes of atomic force microscopy / Anyan Cui, Menghan Deng, Yan Ye, Xiang Wang, Zhigao Hu -- Advanced modes of electrostatic and kelvin probe force microscopy for energy applications / Martí Checa, Sabine M. Neumayer, Wan-Yu Tsai, Liam Collins -- Piezoresponse force microscopy and electrochemical strain microscopy / Qibin Zeng, Kaiyang Zeng -- Hybrid AFM technique : atomic force microscopy -- scanning electrochemical microscopy / Shuang Cao, Tong Sun -- Scanning microwave impedance microscopy / Yongliang Yang, Nicholas Antoniou, Ravi Chintala -- Atomic force microscopy-based infrared microscopy for chemical nano-imaging and spectroscopy / Xiaoji G. Xu -- Application of AFM in lithium batteries research / Rui Wen, Shuang-Yan Lang, Zhen Zhen Shen, Jing Wan -- Application of AFM in solar cell research / Ahmed Touhami -- Application of AFM for analyzing the microstructure of ferroelectric polymer as an energy material / Dong Guoa, Kai Cai, Jingshu Xu -- Application of AFM in microbial energy systems / Xiaochun Tian -- Practical guidance of AFM operations for energy research / Yang Liu, Xin Guo, Yaolun Liu, Xin Wang, Chen Liu, Wenhui Pang, Fei Peng, Shurui Wang, Yo…
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