Title Statements
- Full title :Chemical imaging analysis / Freddy Adams, Department of Chemistry, University of Antwerp, Carlo Barbante, Institute for the Dynamics of Environmental Processes - CNR and Department of Environmental Sciences, Informatics and Statistics University of Venice.
Summary
Chemical Imaging Analysis covers the advancements made over the last 50 years in chemical imaging analysis, including different analytical techniques and the ways they were developed and refined to link the composition and structure of manmade and natural materials at the nano/micro scale to the functional behavior at the macroscopic scale. In a development process that started in the early 1960s, a variety of specialized analytical techniques was developed - or adapted from existing techniques - and these techniques have matured into versatile and powerful tools for visualizing structural and compositional heterogeneity. This text explores that journey, providing a general overview of imaging techniques in diverse fields, including mass spectrometry, optical spectrometry including X-rays, electron microscopy, and beam techniques.
Read More ↓Edition Statements
- Publication Date:©2015
Publication Statements
- Publisher(s):Elsevier
- Place of Publication:Amsterdam, Netherlands
- Language:eng
- Publication Date:©2015
Notes
Includes index.
The Physical Object
- Description:1 online resource
Edition Identifiers
- ISBN:9780444634504, 0444634509
- oclc:ocn910877962
- LC Classification:QD75.22
- Dewey Decimal:543
Table of Contents
Front Cover; Advisory Board; Chemical Imaging Analysis; Copyright; Contents; Series Editor's Preface; Preface; Chapter 1 -- Chemical Imaging Introduction; 1.1 INTRODUCTION; 1.2 SEMICONDUCTORS -- MICROELECTRONICS; 1.3 ANALYTICAL CHEMISTRY AND NANOANALYSIS; 1.4 CONCLUSIONS; REFERENCES; Chapter 2 -- Spatially Confined Analysis; 2.1 INTRODUCTION; 2.2 CHEMICAL IMAGING ANALYSIS; 2.3 POINT ANALYSIS AND 2-D IMAGING ANALYSIS; 2.4 SURFACE ANALYSIS, ELECTRON SPECTROSCOPY FOR SURFACE ANALYSIS; 2.5 DETECTION LIMITS, SENSITIVITY; 2.6 TECHNIQUES BASED ON INNER-SHELL EXCITATION.
2.7 STRUCTURAL ANALYSIS, ELECTRON AND X-RAY DIFFRACTION2.8 METROLOGY AT THE NANOLEVEL; 2.9 CONCLUSION; REFERENCES; Chapter 3 -- History and Present Status of Micro- and Nano-Imaging Analysis; 3.1 INTRODUCTION; 3.2 BEAM AND PROBE TECHNIQUES; 3.3 MASS SPECTROMETRY; 3.4 OPTICAL SPECTROSCOPY; 3.5 X-RAY MICROSCOPY; 3.6 ELECTRON MICROSCOPY; 3.7 SURFACE SENSITIVE ELECTRON SPECTROSCOPY; 3.8 TECHNIQUES BASED ON MEGAELECTRONVOLT PROTONS AND OTHER HEAVY IONS; 3.9 CONCLUSION; REFERENCES; Chapter 4 -- Nanotechnology and Analytical Chemistry; 4.1 INTRODUCTION; 4.2 NANOSTRUCTURAL MATERIALS.
4.3 DNA AND NANOTECHNOLOGY4.4 SPECTROSCOPIC …
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