Electro Static Discharge: Understand, Simulate, and Fix ESD Problems
A thorough and concise treatment of ESD Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as ""the most thorough and concise treatment of the broad ESD continuum that is available."" Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the…
Read More ↓Title Statements
- Full title :Electro Static Discharge : Understand, Simulate, and Fix ESD Problems.
Summary
A thorough and concise treatment of ESD Recognizing its methodic, step-by-step attack of the electrostatic discharge (ESD) problem, the initial release of this book was quoted by specialists as ""the most thorough and concise treatment of the broad ESD continuum that is available."" Now in its Third Edition, this book delivers the same trusted coverage of the topic while also incorporating recent technological advances that have taken place in the engineering community. The book begins with the basics of ESD for humans and objects, and goes on to cover: Effects of ESD.
Read More ↓Edition Statements
- Publication Date:2009.
- Edition:3rd ed
Publication Statements
- Publisher(s):Wiley
- Place of Publication:Hoboken
- Language:eng
- Publication Date:2009.
The Physical Object
- Description:1 online resource (315 pages)
Edition Identifiers
- ISBN:0470397047, 9780470397046, 9780470495063, 0470495065
- oclc:ocn990388947
- LC Classification:TK7870
- Dewey Decimal:621.317
Table of Contents
Electrostatic Discharge; Contents; Preface to the First Edition; Preface to the Third Edition; Acknowledgements; 1. The Electrostatic Discharge Phenomenon; 2. Effects of ESD on Electronics; 3. Principal ESD Specifications; 4. ESD Diagnostics and Testing; 5. Design for ESD Immunity; 6. ESD Cases Studies; Appendix A. ESD Protection by Design of Chips and Microcircuits; Appendix B. Prediction of ESD Damage Level for a Semiconductor Junction; Appendix C. Spark-Over Voltages; Appendix D. Fatigue Phenomena During Repeated ESD Testing.
Appendix E. Prediction of ESD-Induced Noise by Fast Frequency-Domain CalculationsAppendix F. More Experiments on ESD Coupling to Boxes; Appendix G. Examples of Simple SPICE Modeling of ESD Coupling Effects; Appendix H. Time-to-Frequency Conversion for a Single Transient; Index.
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