Electronics reliability and measurement technology

Electronics reliability and measurement technology: nondestructive evaluation

by Heyman, Joseph S.

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Title Statements

  • Full title :Electronics reliability and measurement technology : nondestructive evaluation / edited by Joseph S. Heyman.

Edition Statements

  • Publication Date:©1988.

Publication Statements

  • Publisher(s):Noyes Data Corp
  • Place of Publication:Park Ridge, N.J., U.S.A
  • Language:eng
  • Publication Date:©1988.

Notes

"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii.

The Physical Object

  • Description:xii, 128 p. : : illustrations ; : 27 cm

Edition Identifiers

  • ISBN:081551171X, 9780815511717
  • oclc:ocn803012466

Writers

Heyman, Joseph S.

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