Electronics reliability and measurement technology

Electronics reliability and measurement technology: nondestructive evaluation

by Heyman, Joseph S.

Type Book
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This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Title Statements

  • Full title :Electronics reliability and measurement technology : nondestructive evaluation / edited by Joseph S. Heyman.

Summary

This book examines electronics reliability and measurement technology. It identifies advances in measurement science and technology for nondestructive evaluation, and it details common measurement trouble spots.

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Edition Statements

  • Publication Date:2010.

Publication Statements

  • Publisher(s):Noyes Data Corp
  • Place of Publication:Park Ridge, N.J., U.S.A
  • Language:eng
  • Publication Date:2010.

Notes

"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii. - Includes bibliographical references and index. - Print version record

The Physical Object

  • Description:Online Ressource (xii, 128 Seiten) : : Illustrationen

Edition Identifiers

  • ISBN:1591240514, 9781591240518, 9780815511717, 081551171X, 9780815516996, 0815516991, 9780080944685, 008094468X
  • oclc:on1033806241
  • LC Classification:TK7874
  • Dewey Decimal:621.3810287

Subjects

Circuits intégrés -- Congrès Conference papers and proceedings Contrôle non destructif -- Congrès Integrated circuits -- Congresses nondestructive testing Nondestructive testing -- Congresses

Writers

Heyman, Joseph S.

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