Electronics reliability and measurement technology

Electronics reliability and measurement technology: nondestructive evaluation

by Heyman, Joseph S.

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Title Statements

  • Full title :Electronics reliability and measurement technology : nondestructive evaluation / edited by Joseph S. Heyman.

Edition Statements

  • Publication Date:c 1988.

Publication Statements

The Physical Object

  • Description:XII, 128 p. ; : 26 cm

Edition Identifiers

  • ISBN:081551171X, 9780815511717
  • oclc:ocn875475512

Writers

Heyman, Joseph S.

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