Fourier transform spectroscopy instrumentation engineering
Many applications today require the Fourier-transform (FT) spectrometer to perform close to its limitations, such as taking many quantitative measurements in the visible and in the near infrared wavelength regions. In such cases, the instrument should not be considered as a perfect "black box." Knowing where the limitations of performance arise and which components must be improved are crucial to obtaining repeatable and accurate results. One of the objectives of this book is to help the user i…
Read More ↓Title Statements
- Full title :Fourier transform spectroscopy instrumentation engineering / Vidi Saptari.
Summary
Many applications today require the Fourier-transform (FT) spectrometer to perform close to its limitations, such as taking many quantitative measurements in the visible and in the near infrared wavelength regions. In such cases, the instrument should not be considered as a perfect "black box." Knowing where the limitations of performance arise and which components must be improved are crucial to obtaining repeatable and accurate results. One of the objectives of this book is to help the user identify the instrument's bottleneck.
Read More ↓Edition Statements
- Publication Date:©2004.
Publication Statements
- Publisher(s):SPIE Optical Engineering Press
- Place of Publication:Bellingham, WA
- Language:eng
- Publication Date:©2004.
The Physical Object
- Description:xi, 118 pages : : illustrations ; : 25 cm
Edition Identifiers
- ISBN:0819451649, 9780819451644
- oclc:ocm52773791
- LC Classification:QC454.F7
- Dewey Decimal:621.36/1
Table of Contents
Preface -- Chapter 1 Spectroscopy Instrumentation -- 1.1 Introduction -- 1.2 Types of Spectrometers -- 1.3 Advantages of FT Spectrometers -- 1.4 Discussions on FT Spectrometer Advantages -- References -- Chapter 2 Signal-to-Noise Ratio -- 2.1 Signal-to-Noise Ratio Defined -- 2.2 Quantifying Signal-to-Noise Ratio -- 2.3 Practical Considerations -- Chapter 3 Principles of Interferometer Operation -- 3.1 Overview -- 3.2 Quantitative Explanation -- 3.3 Theoretical Resolution -- 3.4 Interferogram Digital Processing -- References -- Chapter 4 Interferometer Alignment Errors -- 4.1 Error Characteristics -- 4.2 Interferogram-Modulation Error -- 4.3 Interferogram-Sampling Error -- References -- Chapter 5 Motion Components and Systems -- 5.1 Actuators -- 5.2 Driver and Amplifier -- 5.3 Bearings and Coupling Mechanism -- 5.4 Position Sensor -- 5.5 Homodyne Interferometer Sources of Error -- 5.6 Actuator, Sensor, and Mirror Mounting -- 5.7 Digital Motion Controller -- References.
Chapter 6 Interferogram Data Sampling -- 6.1 Step Scan vs. Continuous Scan -- 6.2 Sampling Period -- 6.3 Accuracy with Respect to OPD -- 6.4 Repeatable Clock Position -- 6.5 Hardware Methods -- References -- Chapter…
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