High-resolution electron microscopy

High-resolution electron microscopy

by Spence, John C. H.

Type Book
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This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added. - ;The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. Th…

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Title Statements

  • Full title :High-resolution electron microscopy / John C.H. Spence.

Summary

This book describes how to see atoms using electron microscopes. This new edition includes updated sections on applications and new uses of atomic-resolution transmission electron microscopy. Several new chapters and sources of software for image interpretation and electron-optical design have also been added. - ;The discovery of the Nanotube in 1991 by electron microscopy has ushered in the era of Nanoscience. The atomic-resolution electron microscope has been a crucial tool in this effort. This book gives the basic theoretical background needed to understand how electron microscopes allow us.

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Edition Statements

  • Publication Date:2009.
  • Edition:3rd ed

Publication Statements

The Physical Object

  • Description:1 online resource (425 pages)

Edition Identifiers

  • ISBN:0191708666, 9780191708664, 1281975745, 9781281975744, 9786611975746, 6611975748, 0191564613, 9780191564611, 9780199552757, 0199552754
  • oclc:on1110365417
  • LC Classification:QH212.T7
  • Dewey Decimal:502.825

Table of Contents

1 Preliminaries; 2 Electron Optics; 3 Wave Optics; 4 Coherence and Fourier Optics; 5 High-Resolution Images of Crystals and their Defects; 6 HREM in Biology, Organic Crystals, and Radiation Damage; 7 Image Processing and Super-Resolution Schemes; 8 STEM and Z-contrast; 9 Electron Sources and Detectors; 10 Measurement of Electron-Optical Parameters; 11 Instabilities and the Microscope Environment; 12 Experimental Methods; 13 Associated Techniques; Appendices; Index

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