High resolution X-ray diffractometry and topography

High resolution X-ray diffractometry and topography

by Bowen, D.Keith

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Title Statements

  • Full title :High resolution X-ray diffractometry and topography.

Edition Statements

  • Publication Date:1998.

Publication Statements

  • Publisher(s):Taylor and Francis
  • Place of Publication:London
  • Language:eng
  • Publication Date:1998.

The Physical Object

  • Description:252 blz. ; : .. cm.

Edition Identifiers

  • ISBN:0850667585, 9780850667585
  • oclc:ocn840351710

Subjects

Cristaux crystal (material by form) Crystals Radiocristallographie Rayons X. X rays x-ray (radiation) X-ray crystallography

Writers

Bowen, D.Keith Tanner, Brian K.

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