Introduction to scanning tunneling microscopy

Introduction to scanning tunneling microscopy

by Chen, C. Julian

Type Book
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The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. This is a reference book on the topic.

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Title Statements

  • Full title :Introduction to scanning tunneling microscopy / C. Julian Chen, Department of Applied Physics and Applied Mathematics, Columbia University, New York.

Summary

The scanning tunnelling microscope (STM) was invented by Binnig and Rohrer and received a Nobel Prize of Physics in 1986. Together with the atomic force microscope (AFM), it provides non-destructive atomic and subatomic resolution on surfaces. Especially, in recent years, internal details of atomic and molecular wavefunctions are observed and mapped with negligible disturbance. This is a reference book on the topic.

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Edition Statements

  • Publication Date:2021.
  • Edition:Third edition

Publication Statements

The Physical Object

  • Description:xxxvii, 452 pages, 32 unnumbered pages of plates : : illustrations ; : 25 cm.

Edition Identifiers

  • ISBN:9780198856559, 0198856555
  • oclc:on1242746902
  • LC Classification:QH212.S35
  • Dewey Decimal:502.8/25

Table of Contents

Tunneling phenomenon -- Tunneling matrix elements -- Atomic forces -- Atomic forces and tunneling -- Nanometer-scale imaging -- Atomic-scale imaging -- Imaging wavefunctions -- Nanomechanical effects -- Piezoelectric scanner -- Vibration isolation -- Electronics and control -- Mechanical design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy.

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