Kelvin probe force microscopy

Kelvin probe force microscopy: measuring and compensating electrostatic forces

by Glatzel, Thilo Sadewasser, Sascha

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Title Statements

  • Full title :Kelvin probe force microscopy : measuring and compensating electrostatic forces / Sascha Sadewasser, Thilo Glatzel, editors.

Edition Statements

  • Publication Date:copyright 2012

Publication Statements

  • Publisher(s):Springer
  • Place of Publication:Heidelberg
  • Language:eng
  • Publication Date:copyright 2012

The Physical Object

  • Description:1 vol. (XIV-331 p.) : : ill. ; : 24 cm.

Edition Identifiers

  • ISBN:9783642225659 (rel), 9783642271137 (br), 3642271138 (br), 3642225659 (rel)
  • oclc:ocn801061513
  • LC Classification:QH212.A78
  • Dewey Decimal:681.4

Subjects

Atomic force microscopy Electrostatics -- Measurement Microscopie à force atomique Microscopie électronique à balayage Surfaces (Physique)

Writers

Glatzel, Thilo Sadewasser, Sascha

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