Microelectronic failure analysis: desk reference : 2001 supplement

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Title Statements

Full title :Microelectronic failure analysis : desk reference : 2001 supplement / prepared under the direction of the Electronic Device Failure Analysis Society Publications Committee.

Edition Statements

Publication Date:©2001.

Publication Statements

Publisher(s):ASM International
Place of Publication:Materials Park, OH
Language:eng
Publication Date:©2001.

The Physical Object

Description:1 online resource (v, 171 pages) : : illustrations

Edition Identifiers

ISBN:9781615032655, 1615032657
oclc:ocn647829197
LC Classification:TK7871
Dewey Decimal:621.381

Preface -- Contents -- Focused Ion Beam Backside Isolation Techniques -- Package/Sample Cross Sectioning -- Copper Deprocessing -- Atomic Force Microscopy, Scanning Probe Microscopy, and Scanning Capacitance Microscopy -- Supplementary Information

Subjects

Appareils électroniques -- Guides, manu… Electronic apparatus and appliances -- … Electronic apparatus and appliances -- … Electronics -- Handbooks, manuals, etc.… Electronics -- Materials Handbooks and manuals Microelectronics -- Handbooks, manuals,… Microelectronics -- Materials Microélectronique -- Guides, manuels, e… Semi-conducteurs -- Guides, manuels, et… Semiconductors -- Defects Semiconductors -- Handbooks, manuals, e… TECHNOLOGY & ENGINEERING -- Electronics