Microelectronics failure analysis

Microelectronics failure analysis: desk reference

by Ross, Richard J.

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Title Statements

  • Full title :Microelectronics failure analysis : desk reference.

Edition Statements

  • Publication Date:2011.

Publication Statements

  • Publisher(s):ASM International
  • Place of Publication:Materials Park
  • Language:eng
  • Publication Date:2011.

The Physical Object

  • Description:1 online resource (660 blz.)

Edition Identifiers

  • ISBN:161503725X, 9781615037254, 1615037268, 9781615037261
  • oclc:ocn840461181

Table of Contents

Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.

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Writers

Ross, Richard J.

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