Title Statements
- Full title :Microelectronics failure analysis : desk reference / edited byTejinder Gandhi.
Edition Statements
- Publication Date:©2019
- Edition:Seventh edition
Publication Statements
- Publisher(s):ASM International
- Place of Publication:Materials Park, Ohio
- Language:eng
- Publication Date:©2019
Notes
"An ASM materials solutions publication."
"EDFAS, Electronic Device Failure Analysis Society, ASMInternational."
The Physical Object
- Description:1 ressource en ligne (xi, 705 pages) : : illustrations (certaines encouleur)
Edition Identifiers
- ISBN:1523126329, 1627082468, 1627082476, 9781523126323, 9781627082464, 9781627082471
- oclc:on1285500412
- LC Classification:TK7871
- Dewey Decimal:621.381
Table of Contents
Intro; 01_Overview of Wafer-level Electrical Failure_Pai inputs_addressed; 03_EDFAS Desk Reference Paper -- Susan Li -- 8-5-2019 -- Final; 04_Non-destructive Techniques for Advanced Board Level Failure Analysis; 05_EDFAS Desk Refrence -- FA Lab management article-final; 06_07A Optical Microscopy for Desk Reference 2010_corrected; 07_X-ray imaging tools for electronic device failure analysis_CSFinal_V4; 08_!PUB-2019_EDFAS_SAM_Update_Final-20190731; Acoustic Microscopy of Semiconductor Packages; Cheryl D. Hartfield; Carl Zeiss SMT Inc., Pleasanton,CA, USA; cheryl.hartfield@zeiss.com
011_TDR_EOTPR_TDT_desk_reference_ASM_r4012_Frontsidefinal_9-3-20 19; 013_Backside Preparation and Optics Revision4; 014_Corrected Photon emission article (1); 015_Beam fault isolation corrected; 016_Desk Ref_7thEdition_ Thermal detection_V7_new title_rev1; 017_Desk Ref_7thEdition_3DLIT_V6.1; 018_LADA_SDL_Desk_Reference_Final_Final; 019_Laser Voltage Probing Article -; 020_EDFAS_CAD_Navigation_Principles_7th-Ed; 021_05C MDR_Rosenkranz; 022_EDFAS. Transistor Characterization(Final)_8_30; 023_Fundamentals_Nanoprobe_Final;024_Silicon Device
Crack Detection by Multimode and Shear-Wave ImagingExtending Packa…
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