Microelectronics failure analysis

Microelectronics failure analysis: desk reference

by Gandhi, Tejinder

Type Book
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Title Statements

  • Full title :Microelectronics failure analysis : desk reference / edited byTejinder Gandhi.

Edition Statements

  • Publication Date:©2019
  • Edition:Seventh edition

Publication Statements

  • Publisher(s):ASM International
  • Place of Publication:Materials Park, Ohio
  • Language:eng
  • Publication Date:©2019

Notes

"An ASM materials solutions publication."

"EDFAS, Electronic Device Failure Analysis Society, ASMInternational."

The Physical Object

  • Description:1 ressource en ligne (xi, 705 pages) : : illustrations (certaines encouleur)

Edition Identifiers

  • ISBN:1523126329, 1627082468, 1627082476, 9781523126323, 9781627082464, 9781627082471
  • oclc:on1285500412
  • LC Classification:TK7871
  • Dewey Decimal:621.381

Table of Contents

Intro; 01_Overview of Wafer-level Electrical Failure_Pai inputs_addressed; 03_EDFAS Desk Reference Paper -- Susan Li -- 8-5-2019 -- Final; 04_Non-destructive Techniques for Advanced Board Level Failure Analysis; 05_EDFAS Desk Refrence -- FA Lab management article-final; 06_07A Optical Microscopy for Desk Reference 2010_corrected; 07_X-ray imaging tools for electronic device failure analysis_CSFinal_V4; 08_!PUB-2019_EDFAS_SAM_Update_Final-20190731; Acoustic Microscopy of Semiconductor Packages; Cheryl D. Hartfield; Carl Zeiss SMT Inc., Pleasanton,CA, USA; cheryl.hartfield@zeiss.com

011_TDR_EOTPR_TDT_desk_reference_ASM_r4012_Frontsidefinal_9-3-20 19; 013_Backside Preparation and Optics Revision4; 014_Corrected Photon emission article (1); 015_Beam fault isolation corrected; 016_Desk Ref_7thEdition_ Thermal detection_V7_new title_rev1; 017_Desk Ref_7thEdition_3DLIT_V6.1; 018_LADA_SDL_Desk_Reference_Final_Final; 019_Laser Voltage Probing Article -; 020_EDFAS_CAD_Navigation_Principles_7th-Ed; 021_05C MDR_Rosenkranz; 022_EDFAS. Transistor Characterization(Final)_8_30; 023_Fundamentals_Nanoprobe_Final;024_Silicon Device

Crack Detection by Multimode and Shear-Wave ImagingExtending Packa…

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