Microelectronics failure analysis

Microelectronics failure analysis: desk reference

by Ross, Richard J.

Type Book
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Title Statements

  • Full title :Microelectronics failure analysis : desk reference / edited by Richard J. Ross.

Edition Statements

  • Publication Date:c2011.
  • Edition:6th ed

Publication Statements

  • Publisher(s):ASM International
  • Place of Publication:Materials Park, Ohio
  • Language:eng
  • Publication Date:c2011.

The Physical Object

  • Description:xi, 660 p. : : ill.

Edition Identifiers

  • ISBN:9781615037261, 1615037268
  • oclc:on1261939960
  • LC Classification:TK7871
  • Dewey Decimal:621.381

Table of Contents

Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.

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