Microelectronics failure analysis: desk reference

by Gandhi, Tejinder

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Title Statements

Full title :Microelectronics failure analysis : desk reference / edited by Tejinder Gandhi.

Edition Statements

Publication Date:©2019
Edition:Seventh edition

Publication Statements

Publisher(s):ASM International
Place of Publication:Materials Park, Ohio
Language:eng
Publication Date:©2019

Notes

"An ASM materials solutions publication."

"EDFAS, Electronic Device Failure Analysis Society, ASM International."

The Physical Object

Description:1 online resource (xi, 705 pages) : : illustrations (some color)

Edition Identifiers

ISBN:9781627082471, 1627082476, 9781627082464, 1627082468, 9781523126323, 1523126329
oclc:on1128706105
LC Classification:TK7871
Dewey Decimal:621.381

Intro; 01_Overview of Wafer-level Electrical Failure_Pai inputs_addressed; 03_EDFAS Desk Reference Paper -- Susan Li -- 8-5-2019 -- Final; 04_Non-destructive Techniques for Advanced Board Level Failure Analysis; 05_EDFAS Desk Refrence -- FA Lab management article-final; 06_07A Optical Microscopy for Desk Reference 2010_corrected; 07_X-ray imaging tools for electronic device failure analysis_CSFinal_V4; 08_!PUB-2019_EDFAS_SAM_Update_Final-20190731; Acoustic Microscopy of Semiconductor Packages; Cheryl D. Hartfield; Carl Zeiss SMT Inc., Pleasanton, CA, USA; cheryl.hartfield@zeiss.com

Thomas M. MooreWaviks Inc., Dallas, TX, USA; tom.moore@waviks.com; Sebastian Brand; Fraunhofer IMWS, Halle, Germany; sebastian.brand@imws.fraunhofer.de; Introduction; History; The C-scan; The Stanford SAM; Today's SAM for IC Package Inspection; Early SAM Applications in the IC Industry; An Important Tool for Popcorn Crack Detection; Theoretical Considerations; Overview: Acoustic Microscopy for IC Package Inspection; Types of Reflected Signal Analysis Modes:; Polarity Analysis of Reflected Signals; Time of Flight Imaging Using Reflected Signals; Resolution and Sensitivity of SAM Inspection

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Subjects

Appareils électroniques -- Guides, manu… Electronic apparatus and appliances -- … Electronic apparatus and appliances -- … Electronics -- Handbooks, manuals, etc.… Electronics -- Materials Handbooks and manuals Microelectronics -- Handbooks, manuals,… Microelectronics -- Materials Microélectronique -- Guides, manuels, e… Semi-conducteurs -- Guides, manuels, et… Semiconductors -- Defects Semiconductors -- Handbooks, manuals, e…