Microprobe Techniques in the Earth Sciences

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30% discount for members of The Mineralogical Society of Britain and Ireland This text covers the range of microanalytical techniques available for the analysis of geological samples, principally in research applications. Each chapter is written in a clear, informative style and has a tutorial element, designed to introduce each technique for the beginning and experienced researcher alike.

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Title Statements

Full title :Microprobe Techniques in the Earth Sciences / edited by Philip J. Potts, John F.W. Bowles, Stephen J.B. Reed, Mark R. Cave.

Summary

Edition Statements

Publication Date:1995.

Publication Statements

Publisher(s):Springer US
Place of Publication:Boston, MA
Language:eng
Publication Date:1995.

The Physical Object

Description:1 online resource (432 pages)

Edition Identifiers

ISBN:9781461520535, 1461520533
oclc:ocn852790305
LC Classification:QE514-516.5
Dewey Decimal:551.9

1 Microanalysis from 1950 to the 1990s -- 1.1 Introduction -- 1.2 Microscope methods with image-plane selection -- 1.3 Microprobe methods -- 1.4 The possibilities: primary and secondary beams -- 1.5 Some history -- 1.6 Quantitative analysis -- 1.7 Precision, accuracy and resolution -- 1.8 Other techniques using electrons and/or X-rays -- 1.9 Selected-area mass spectrometry with direct excitation -- 1.10 Selected-area mass spectrometry with indirect excitation -- 1.11 Laser heating -- 1.12 Detection of molecular species -- 1.13 Which technique? Analytical strategy and tactics -- References -- 2 Electron microprobe microanalysis -- 2.1 Introduction -- 2.2 X-ray spectroscopy -- 2.3 Wavelength-dispersive spectrometers -- 2.4 Energy-dispersive spectrometers -- 2.5 The electron column -- 2.6 Scanning and mapping -- 2.7 Qualitative analysis -- 2.8 Quantitative analysis -- experimental -- 2.9 Quantitative analysis -- data reduction -- References -- Further reading -- 3 Analytical electron microscopy -- 3.1 Introduction -- 3.2 The X-ray analysis of thin specimens -- 3.3 Electron energy-loss spectroscopy -- 3.4 EDS versus EELS -- 3.5 Future directions of AEM instrumentation -- Acknowledgeme…