Title Statements
- Full title :Molecular modeling and multiscaling issues for electronic material applications / Nancy Iwamoto, Matthew M.F. Yuen, Haibo Fan, editors.
Edition Statements
- Publication Date:2012.
Publication Statements
- Publisher(s):Springer
- Place of Publication:New York
- Language:eng
- Publication Date:2012.
The Physical Object
- Description:1 online resource (xi, 258 pages) : : illustrations (some color)
Edition Identifiers
- ISBN:9781461417286, 1461417287, 1461417279, 9781461417279
- DOI:10.1007/978-1-4614-1728-6
- oclc:ocn905286712
- Dewey Decimal:620.1
Table of Contents
Part 1. Quantum Mechanics and Molecular Methods: Uses for property understanding. Atomistic Simulations of Microelectronic Materials: Prediction of Mechanical, Thermal, and Electrical Properties / V. Eyert, A. Mavromaras, D. Rigby, W. Wolf, M. Christensen, M. Halls, C. Freeman -- Using Molecular Modeling Trending to Understand Dielectric Susceptibility in Dielectrics for Display Applications / Nancy Iwamoto, Ahila Krishnamoorthy, Edward W. Rutter Jr -- Understanding Cleaner Efficiency for BARC ("Bottom Anti-Reflective Coating") After Plasma Etch in Dual Damascene Structures Through the Practical Use of Molecular Modeling Trends / Nancy Iwamoto, Deborah Yellowaga, Amy Larson, Ben Palmer, Teri Baldwin-Hendricks -- Part 2. Large scale atomistic methods and scaling methods to understand mechanical failure in metals. Roles of Grain Boundaries in the Strength of Metals by Using Atomic Simulations / Tomotsugu Shimokawa -- Semi Emprical Low Cycle Fatigue Crack Growth Analysis of Nanostructure Chip-To-Package Copper Interconnect Using Molecular Simulation / S. Koh, A. Saxena, Willem Van Driel, G.Q. (Kouchi) Zhang, R. Tummala -- Part 3. Molecular scale modeling uses for Carbon Nanotube beha…
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