MOS interface physics, process and characterization

MOS interface physics, process and characterization

by Wang, Shengkai

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Title Statements

  • Full title :MOS interface physics, process and characterization / Shengkai Wang, Xiaolei Wang.

Edition Statements

  • Publication Date:2021.

Publication Statements

  • Publisher(s):CRC Press
  • Place of Publication:Boca Raton
  • Language:eng
  • Publication Date:2021.

The Physical Object

  • Description:1 online resource (1 volume) : : illustrations (black and white)

Edition Identifiers

  • ISBN:9781000455762, 1000455769, 9781000455748, 1000455742, 9781003216285, 1003216285
  • DOI:10.1201/9781003216285
  • oclc:on1290728203
  • LC Classification:TK7871.99.M44
  • Dewey Decimal:621.3815284

Subjects

Circuits intégrés -- Recherche Electronic books Integrated circuits -- Research Metal oxide semiconductors -- Design an… Physique de l'état solide -- Expériences Semi-conducteurs -- Jonctions Semiconductors -- Junctions Solid state physics -- Experiments

Writers

Wang, Shengkai Wang, Xiaolei

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