MOS interface physics, process and characterization

MOS interface physics, process and characterization

by Wang, Shengkai

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Title Statements

  • Full title :MOS interface physics, process and characterization / Shengkai Wangand Xiaolei Wang.

Edition Statements

  • Publication Date:2022.
  • Edition:First edition

Publication Statements

The Physical Object

  • Description:1 ressource en ligne (xi, 161 pages) : : illustrations

Edition Identifiers

  • ISBN:9781000455762, 1000455769, 9781032106274, 1032106271
  • oclc:on1335024505
  • LC Classification:TK7871.99.M44
  • Dewey Decimal:621.3815284

Subjects

Integrated circuits -- Research Livres numériques Metal oxide semiconductors -- Design an… Semi-conducteurs -- Jonctions Semiconductors -- Junctions Solid state physics -- Experiments

Writers

Wang, Shengkai Wang, Xiaolei

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