Title Statements
- Full title :Quantitative X-ray Spectrometry / Ron Jenkins, R.W. Gould, Dale Gedcke.
Summary
This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals and alloys, minerals and ore, ceramic materials, catalysts and trace metals.;This work is intended for spectroscopists, analytical chemists, materials scientists, experimental physicists, mineralogists, biologists, geologists and graduate-level students in these disciplines.
Read More ↓Edition Statements
- Publication Date:1995
- Edition:Second edition
Publication Statements
- Publisher(s):Marcel Dekker
- Place of Publication:New York, NY
- Language:eng
- Publication Date:1995
The Physical Object
- Description:x, 484, [1] sidor : illustrationer : 24 cm.
Edition Identifiers
- ISBN:9780824795542, 0824795547
- oclc:on1306197350
- LC Classification:QD96.X2
- Dewey Decimal:543.62
Table of Contents
Introduction -- The interaction of X-rays with matter -- Sources for the excitation of characteristic X-rays -- Instrumentation -- Statistics -- General computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis -- Specimen preparation -- Qualitative analysis -- basic problems in quantitative analysis -- Methods and models for quantitative analysis -- Trace analysis -- Radiation health hazards in X-ray spectrometry -- Applications of X-ray spectrometry. APPENDICES -- Nomenclature -- Mass absorption coefficients -- Conversions and physical constants -- Atomic weights and densities -- Wavelengths and energies -- Wavelength tables for K, L, and M series.
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