RF and microwave modeling and measurement techniques for field effect transistors

Title Statements

• Full title :RF and microwave modeling and measurement techniques for field effect transistors / Jianjun Gao

Edition Statements

• Publication Date:2010

Publication Statements

• Publisher(s):SciTech Publ
• Place of Publication:Raleigh, NC
• Language:eng
• Publication Date:2010

Notes

The Physical Object

• Description:X, 339 S. : Ill., graph. Darst.

Edition Identifiers

• ISBN:9781891121890, 1891121898
• oclc:ocn752356164
• Dewey Decimal:621.3815284

Writers