Title Statements
- Full title :Schlieren methods / by L.A. Vasilʹev ; translated by A. Baruch.
Edition Statements
- Publication Date:1971.
Publication Statements
- Publisher(s):Israel Program; [distributed by Keter Inc.] New York
- Place of Publication:Jerusalem
- Language:eng
- Publication Date:1971.
Notes
Translation of Tenevye metody.
Includes subject index.
The Physical Object
- Description:xiv, 367 pages : : illustrations ; : 25 cm
Edition Identifiers
- ISBN:070651100X, 9780706511000
- oclc:ocm02656745
- LC Classification:QC373.S3
- Dewey Decimal:535/.33
Table of Contents
pt. I. The geometrical theory of schlieren methods. Qualitative schlieren methods -- Quantitative zone methods -- Some special systems -- Defocused grid methods -- Photometric methods -- Soviet-made schlieren instruments -- Mounting and adjustment of schlieren instruments -- Methods of calculation of inhomogeneities -- The relation of the refractive index to other characteristics of the medium -- pt. II. The diffraction theory of schlieren methods. Calculation of the illumination distribution in the image plane with allowance for diffraction phenomena -- Errors in the study of plane waves -- Allowance for the light wave curvature -- Utilization of diffraction in measurements.
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