Secondary ion mass spectrometry

Secondary ion mass spectrometry: applications for depth profiling and surface characterization

by Stevie, Fred A.

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Title Statements

  • Full title :Secondary ion mass spectrometry : applications for depth profiling and surface characterization / Fred A. Stevie, Analytical Instrumentation Facility, North Carolina State University.

Edition Statements

  • Publication Date:2016
  • Edition:1. published

Publication Statements

  • Publisher(s):Momentum Press
  • Place of Publication:New York
  • Language:eng
  • Publication Date:2016

The Physical Object

  • Description:XX, 262 Seiten. : : Illustrationen.

Edition Identifiers

  • ISBN:1606505882, 9781606505885
  • oclc:on1039135929
  • Dewey Decimal:543.0873

Writers

Stevie, Fred A.

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