Semiconductor memories: technology, testing, and reliability
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Title Statements
- Full title :Semiconductor memories : technology, testing, and reliability / Ashok K. Sharma.
Edition Statements
- Publication Date:©1997.
Publication Statements
- Publisher(s):Institute of Electrical and Electronics Engineers
- Place of Publication:New York
- Language:eng
- Publication Date:©1997.
The Physical Object
- Description:XII, 462 p. : : ill. ; : 27 cm
Edition Identifiers
- ISBN:0780311140, 9780780311145
- oclc:ocn900072978
- Dewey Decimal:621.39732
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