Statistical methods for reliability data
This volume presents state-of-the-art, computer-based statistical methods for reliability data analysis and test planning for industrial products. Statistical Methods for Reliability Data updates and improves established techniques as it demonstrates how to apply the new graphical, numerical, or simulation-based methods to a broad range of models encountered in reliability data analysis. It includes methods for planning reliability studies and analyzing degradation data, simulation methods used…
Read More ↓Title Statements
- Full title :Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar.
Summary
This volume presents state-of-the-art, computer-based statistical methods for reliability data analysis and test planning for industrial products. Statistical Methods for Reliability Data updates and improves established techniques as it demonstrates how to apply the new graphical, numerical, or simulation-based methods to a broad range of models encountered in reliability data analysis. It includes methods for planning reliability studies and analyzing degradation data, simulation methods used to complement large-sample asymptotic theory, general likelihood-based methods of handling arbitrarily censored data and truncated data, and more.
Read More ↓Edition Statements
- Publication Date:©1998.
Publication Statements
- Publisher(s):Wiley
- Place of Publication:New York
- Language:eng
- Publication Date:©1998.
Notes
"A Wiley-Interscience publication."
The Physical Object
- Description:1 online resource (xxii, 680 pages) : : illustrations.
Edition Identifiers
- ISBN:0585317240, 9780585317243, 9780471673279, 0471673277, 9781118625972, 1118625978, 9780471143284, 0471143286
- oclc:ocm45728623
- LC Classification:TS173
- Dewey Decimal:620/.00452
Table of Contents
Reliability concepts and reliability data -- Models, censoring, and likelihood for failure-time data -- Nonparametric estimation -- Location-scale-based parametric distributions -- Other parametric distributions -- Probability plotting -- Parametric likelihood fitting concepts: exponential distribution -- Maximum likelihood for log-location-scale distributions -- Bootstrap confidence intervals -- Planning life tests -- Parametric maximum likelihood: other models -- Prediction of future random quantities -- Degradation data, models, and data analysis -- Introduction to the use of bayesian methods for reliability data -- System reliability concepts and methods -- Analysis of repairable system and other recurrence data -- Failure-time regression analysis -- Accelerated test models -- Accelerated life tests -- Planning accelerated life tests -- Accelerated degradation tests -- Case studies and further applications.
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