A parallel testing algorithm for pattern sensitive faults in random access memory

Type Thesis

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Summary

A pattern sensitive fault recognition algorithm (PSFRA) is presented that not only detects and locates the neighborhood pattern sensitive faults (NPSF) but also it recognizes the types of the fault. A parallel testing structure for NPSF in Random Access Memory (RAM) has been developed in (1) to reduce overall test time and cost. It is designed for a broad class of pattern-sensitive faults and is significantly more efficient than previous approaches. The algorithm is modified to provide a fault type recognition capability that helps in differentiating between active, passive, and static NPSF for Type-1 and Type-2 neighborhood. The PSFRA needs 321 N¹/² write operations and 480 N¹/² read operations for Type-1 neighborhood, and it needs 129 N¹/² write operations and 192 N¹/² read operations for Type-2 neighborhood (N is the memory size). The recognition of fault is in expense of more test time and it is still more efficient than sequential algorithms.