Advanced computing in electron microscopy
This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.
Read More ↓Title Statements
- Full title :Advanced computing in electron microscopy / Earl J. Kirkland
Summary
This review of numerical computation methods in high resolution conventional and scanning transmission electron microscope images shows how image calculations help separate information from artifact. Updated with instrumental developments and new references.
Read More ↓Edition Statements
- Publication Date:©2020
- Edition:Third edition
Publication Statements
- Publisher(s):Springer, Springer Nature Switzerland AG
- Place of Publication:Cham, Switzerland
- Language:eng
- Publication Date:©2020
The Physical Object
- Description:xii, 354 pages : : illustrations ; : 24 cm
Edition Identifiers
- ISBN:9783030332594, 3030332594
- oclc:on1119626742
- LC Classification:QH212.E4
Table of Contents
Introduction -- The Transmission Electron Microscope -- Some Image Approximations -- Sampling and the Fast Fourier Transform -- Calculation of Images of Thin Specimens -- Theory of Calculation of Images of Thick Specimens -- Multislice Applications and Examples -- The Programss -- App. A: Plotting Transfer Functions -- App. B: The Fourier Projection Theorem -- App. C: Atomic Potentials and Scattering Factors -- App. D: The Inverse Problem -- App. E: Bilinear Interpolation -- App. F: 3D Perspective View.
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