An introduction to the event-related potential technique

An introduction to the event-related potential technique

by Luck, Steven J., (Steven John)

Type Book
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The event-related potential (ERP) technique, in which neural responses to specific events are extracted from the EEG, provides a powerful noninvasive tool for exploring the human brain. This volume describes practical methods for ERP research along with the underlying theoretical rationale. It offers researchers and students an essential guide to designing, conducting, and analyzing ERP experiments. This second edition has been completely updated, with additional material, new chapters, and mor…

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Title Statements

  • Full title :An introduction to the event-related potential technique / Steven J. Luck.

Summary

The event-related potential (ERP) technique, in which neural responses to specific events are extracted from the EEG, provides a powerful noninvasive tool for exploring the human brain. This volume describes practical methods for ERP research along with the underlying theoretical rationale. It offers researchers and students an essential guide to designing, conducting, and analyzing ERP experiments. This second edition has been completely updated, with additional material, new chapters, and more accessible explanations.

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Edition Statements

  • Publication Date:2014
  • Edition:Second edition

Publication Statements

  • Publisher(s):The MIT Press
  • Place of Publication:Cambridge, Massachusetts
  • Language:eng
  • Publication Date:2014

Notes

"A Bradford book."

The Physical Object

  • Description:x, 406 pages : : illustrations ; : 23 cm

Edition Identifiers

  • ISBN:9780262525855, 0262525852, 9780262324052, 0262324059
  • oclc:ocn861671073
  • LC Classification:QP376.5
  • Dewey Decimal:616.8/047547

Table of Contents

A broad overview of the event-related potential technique -- A closer look at ERPs and ERP components -- Overview of common ERP components -- The design of ERP experiments -- Basic principles of ERP recording -- Artifact rejection and correction -- Basics of Fourier analysis and filtering -- Baseline correction, averaging, and time-frequency analysis -- Quantifying ERP amplitudes and latencies -- Statistical analysis.

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