Design-for-test for digital IC's and embedded core systems

Design-for-test for digital IC's and embedded core systems

by Crouch, Alfred L.

Type Book
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Title Statements

  • Full title :Design-for-test for digital IC's and embedded core systems / Alfred L. Crouch.

Edition Statements

  • Publication Date:©1999.

Publication Statements

  • Publisher(s):Prentice Hall PTR
  • Place of Publication:Upper Saddle River, NJ
  • Language:eng
  • Publication Date:©1999.

The Physical Object

  • Description:xxvii, 349 p. : : ill. ; : 25 cm

Edition Identifiers

  • ISBN:0130848271, 9780130848277
  • oclc:ocn757431683
  • LC Classification:TK7874.65

Subjects

Circuit intégré numérique Conception en vue du test Maintenance assistée par ordinateur Test de circuits intégrés Test intégré

Writers

Crouch, Alfred L.

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