Title Statements
- Full title :Embedded mechatronic systems. / edited by Abdelkhalak El Hami, Philippe Pougnet.
Summary
In operation, mechatronics embedded systems are stressed by loads of different causes: climate (temperature, humidity), vibration, electrical and electromagnetic. These stresses in components which induce failure mechanisms should be identified and modeled for better control. AUDACE is a collaborative project of the cluster Mov'eo that address issues specific to mechatronic reliability embedded systems. AUDACE means analyzing the causes of failure of components of mechatronic systems onboard. The goal of the project is to optimize the design of mechatronic devices by reliability. The projec.
Read More ↓Edition Statements
- Publication Date:©2015
Publication Statements
- Publisher(s):Elsevier, ISTE Press
- Place of Publication:London, England
- Language:eng
- Publication Date:©2015
The Physical Object
- Description:1 online resource (263 pages)
Edition Identifiers
- ISBN:0081004842, 9780081004845, 1785480138, 9781785480133, 9781785481895, 1785481894, 9780081019559, 0081019556
- oclc:on1058408530
- LC Classification:TJ223.A25
- Dewey Decimal:006.2
Table of Contents
Front Cover; Embedded Mechatronic Systems; Copyright; Contents; Preface; Chapter 1: Reliability-Based Design Optimization; 1.1. Introduction; 1.2. Reliability-Based Design Optimization; 1.3. Conclusion; 1.4. Bibliography; Chapter 2: Non-Destructive Characterization by Spectroscopic Ellipsometry of Interfaces in Mechatronic Devices; 2.1. Introduction; 2.2. Relationship Between the Ellipsometric Parameters and the Optical Characteristics of a Sample; 2.3. Rotating Component or Phase Modulator Ellipsometers; 2.4. Relationship Between Ellipsometric Parameters and Intensity of the Detected Signal.
2.5. Analysis of Experimental Data2.6. The Stack Structural Model; 2.7. The Optical Model; 2.8. Application of Ellipsometry Technique; 2.9. Conclusion; 2.10. Bibliography; Chapter 3: Method of Characterizing the Electromagnetic Environment in Hyperfrequency Circuits Encapsulated within Metallic Cavities; 3.1. Introduction; 3.2. Theory of Metallic Cavities; 3.3. Effect of Metal Cavities on the Radiated Emissions of Microwave Circuits; 3.4. Approximation of the Electromagnetic Field Radiated in the Presence of the Cavity from the Electromagnetic Field Radiated without Cavity; 3.5. Conclusion.
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