Kelvin probe force microscopy

Kelvin probe force microscopy: measuring and compensating electrostatic forces

by Glatzel, Thilo Sadewasser, Sascha

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Title Statements

  • Full title :Kelvin probe force microscopy : measuring and compensating electrostatic forces / Sascha Sadewasser ; Thilo Glatzel ed.

Edition Statements

  • Publication Date:2012

Publication Statements

  • Publisher(s):Springer
  • Place of Publication:Berlin
  • Language:eng
  • Publication Date:2012

Notes

Literaturangaben

The Physical Object

  • Description:XIV, 331 S. : Ill., graph. Darst. : 25 cm

Edition Identifiers

  • ISBN:9783642225659, 9783642271137, 3642271138, 3642225659, 9783642225666, 3642225667
  • oclc:ocn844902749
  • Dewey Decimal:530.417

Subjects

(Keywords)Kelvin probe microscopy (Keywords)Nanotechnology (Keywords)scanning probe microscopy (Keywords)Surface potential (Keywords)Surface science (Produktform)Hardback (Zielgruppe)Professional/practitioner Kelvin-Sonde Rasterkraftmikroskopie

Writers

Glatzel, Thilo Sadewasser, Sascha

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