RF and microwave modeling and measurement techniques for field effect transistors

RF and microwave modeling and measurement techniques for field effect transistors

by Gao, Jianjun

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Title Statements

  • Full title :RF and microwave modeling and measurement techniques for field effect transistors / Jianjun Gao.

Edition Statements

  • Publication Date:2010.

Publication Statements

  • Publisher(s):Scitech
  • Place of Publication:Raleigh
  • Language:eng
  • Publication Date:2010.

The Physical Object

  • Description:x, 339 str. : : ilustr. ; : 24 cm

Edition Identifiers

  • ISBN:9781891121890, 1891121898
  • oclc:ocn781096522
  • Dewey Decimal:621.3815/284

Subjects

Composés semi-conducteurs -- Modèles ma… Compound semiconductors -- Mathematical… Compound semiconductors -- Testing elektrotehnika Field-effect transistors -- Mathematica… Field-effect transistors -- Testing Mesures micro-ondes Mesures radioélectriques Microwave measurements Radio measurements Transistors à effet de champ -- Modèles…

Writers

Gao, Jianjun

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