Secondary ion mass spectrometry

Secondary ion mass spectrometry: applications for depth profiling and surface characterization

by Stevie, Fred A.

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Title Statements

  • Full title :Secondary ion mass spectrometry : applications for depth profiling and surface characterization / Fred A. Stevie.

Edition Statements

  • Publication Date:cop. 2016.

Publication Statements

  • Publisher(s):Momentum Press
  • Place of Publication:New York
  • Language:eng
  • Publication Date:cop. 2016.

The Physical Object

  • Description:XX, 262 str. : : ilustr. ; : 23 cm.

Edition Identifiers

  • ISBN:9781606505885, 1606505882
  • oclc:on1039629819
  • Dewey Decimal:543.0873

Subjects

masna spektrometrija Materials Science Science des matériaux Secondary ion mass spectrometry Spectrométrie de masse des ions seconda…

Writers

Stevie, Fred A.

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