This volume is devoted to the physics, instrumentation and analytical methods of secondary ion mass spectroscopy (SIMS) in relation to solid surfaces. It describes modern models of secondary ion formation and the factors influencing sensitivity of measurements and the range of a…
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"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"--
This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"
"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications."
A practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS), this book introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to which it is applied using up-to-date illustrations. --
"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"-
"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"-
"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"--
"This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"--
Secondary ion mass spectrometry in the earth sciences: gleaning the big picture from a small spot ; shor…
by International Association of Hydrogeologists, Mineralogical Association of Canada, Geological Association of Canada, Fayek, Mostafa, Canadian Geophysical Union, American Geophysical Union, Joint assembly of the AGU, GAC, MAC, CGU and IAH, Short Course
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Type: Book
Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a …
Secondary ion mass spectrometry (SIMS) is a mass spectrometric technique for solid materials that can provide elemental analysis at parts per million sensitivity and lateral resolution of 50 nm. When those capabilities are combined with the ability to provide that analysis as a …
