Single-photon imaging

Single-photon imaging

by Seitz, Peter Theuwissen, Albert J. P.

Type Book
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The acquisition and interpretation of images is a central capability in almost all scientific and technological domains. In particular, the acquisition of electromagnetic radiation, in the form of visible light, UV, infrared, X-ray, etc. is of enormous practical importance. The ultimate sensitivity in electronic imaging is the detection of individual photons. With this book, the first comprehensive review of all aspects of single-photon electronic imaging has been created. Topics include theore…

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Title Statements

  • Full title :Single-photon imaging / Peter Seitz, Albert J.P. Theuwissen, editors.

Summary

The acquisition and interpretation of images is a central capability in almost all scientific and technological domains. In particular, the acquisition of electromagnetic radiation, in the form of visible light, UV, infrared, X-ray, etc. is of enormous practical importance. The ultimate sensitivity in electronic imaging is the detection of individual photons. With this book, the first comprehensive review of all aspects of single-photon electronic imaging has been created. Topics include theoretical basics, semiconductor fabrication, single-photon detection principles, imager design and applications of different spectral domains. Today, the solid-state fabrication capabilities for several types of image sensors has advanced to a point, where uncoooled single-photon electronic imaging will soon become a consumer product. This book is giving a specialistþs view from different domains to the forthcoming "single-photon imaging" revolution. The various aspects of single-photon imaging are treated by internationally renowned, leading scientists and technologists who have all pioneered their respective fields

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Edition Statements

  • Publication Date:©2011.

Publication Statements

  • Publisher(s):Springer
  • Place of Publication:Berlin
  • Language:eng
  • Publication Date:©2011.

The Physical Object

  • Description:1 online resource (xviii, 351 pages) : : illustrations

Edition Identifiers

  • ISBN:9783642184437, 364218443X, 9783642184420, 3642184421
  • DOI:10.1007/978-3-642-18443-7.
  • oclc:ocn747105605
  • LC Classification:TA1750
  • Dewey Decimal:621.381/045

Table of Contents

Fundamentals of noise in optoelectronics -- Semiconductor technology for single-photon image sensing -- Hybrid Avalanche Photodiode Array (APD) Imaging -- Electron Bombarded Semiconductor Image Sensors -- Silicon Photomultipliers, SiPM -- Electron-Multiplying CDs, EMCCD -- Monolithic Single-Photon Avalanche Photodetectors, SPAD -- Single-photon CMOS imaging through bandwidth optimization -- Architectures for low-noise CMOS electronic imaging -- Low-noise electronic imaging with double-gate FETs and charge-modulation devices -- Energy-sensitive single-photon X-ray and particle imaging -- Single-photon imaging for astronomy and aerospace applications -- Single-photon imaging for the life sciences -- Single-photon imaging for time-of-flight range 3D imaging.

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