by Lombardi, Fabrizio, IEEE International Workshop on Memory Technology, Design, and Testing, San Jose, Calif.), Rajsuman, Rochit, Wik, T., (Thomas), IEEE Computer Society., Technical Committee on VLSI, IEEE Computer Society., Test Technology Technical Committee
by IEEE Computer Society, Lombardi, Fabrizio, IEEE Solid-State Circuits Society, Rajsuman, Rochit, Wik, T., (Thomas), IEEE Computer Society., Technical Committee on VLSI, IEEE Computer Society., Test Technology Technical Committee, MTDT 1997, San Jose, Calif.), Institute of Electrical and Electronics Engineers
by Lombardi, Fabrizio, IEEE International Workshop on Memory Technology, Design, and Testing, San Jose, Calif.), Rajsuman, Rochit, Wik, T., (Thomas), IEEE Computer Society., Technical Committee on VLSI, IEEE Computer Society., Test Technology Technical Committee
by Lombardi, Fabrizio, IEEE International Workshop on Memory Technology, Design, and Testing, San Jose, Calif.), Rajsuman, Rochit, Wik, T., (Thomas), IEEE Computer Society., Technical Committee on VLSI, IEEE Computer Society., Test Technology Technical Committee
by Lombardi, Fabrizio, IEEE International Workshop on Memory Technology, Design, and Testing, San Jose, Calif.), Rajsuman, Rochit, Wik, T., (Thomas), IEEE Computer Society., Technical Committee on VLSI, IEEE Computer Society., Test Technology Technical Committee, IEEE Solid-State Circuits Council
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