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INSPEC

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Process technology for silicon carbide devices

Process technology for silicon carbide devices

by Institution of Electrical Engineers, Zetterling, Carl-Mikael

fromEMIS processing series

0 Type: Book

Process technology for silicon carbide devices

Process technology for silicon carbide devices

by Institution of Electrical Engineers, Zetterling, Carl-Mikael

fromEMIS processing series

0 Type: Book

Process technology for silicon carbide devices

Process technology for silicon carbide devices

fromEMIS processing series

0 Type: Book

Process technology for silicon carbide devices

Process technology for silicon carbide devices

by Zetterling, Carl-Mikael

fromEMIS processing series

0 Type: Book

Process technology for silicon carbide devices

Process technology for silicon carbide devices

by Zetterling, Carl-Mikael

fromEMIS processing series

0 Type: Book

Process technology for silicon carbide devices

Process technology for silicon carbide devices

by Zetterling, Carl-Mikael

fromEMIS processing series

0 Type: Book

Process technology for silicon carbide devices

Process technology for silicon carbide devices

by Institution of Electrical Engineers, Zetterling, Carl-Mikael

fromEMIS processing series

0 Type: Book

Silicon wafer bonding technology for VLSI and MEMS applications

Silicon wafer bonding technology for VLSI and MEMS applications

by Iyer, S. S., Auberton-Herve, A. J.

0 Type: Book

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Subjects

Gallium arsenide semiconducto… (8) Arséniure de gallium (7) Gallium arsenide (7) Semiconductors (7) Amorphous substances (6) Carbon -- Electric properties (6) Gallium nitride (6) Light emitting diodes (6) Semi-conducteurs (6) Substances amorphes (6) semiconductor (6) Aufsatzsammlung (5) SEMICONDUCTORS (MATERIALS) (5) Silicon carbide -- Electric p… (5) Wide gap semiconductors (5) Application (4) Cristaux liquides (4) Diodes électroluminescentes (4) Liquid crystals (4) Nitrure de gallium (4) Amorpher Zustand (3) Bibvir (3) Galliumarsenid (3) Indium alloys (3) Indium phosphide (3) Kohlenstoff (3) PHYSICAL PROPERTIES OF ELEMEN… (3) PHYSIKALISCHE EIGENSCHAFTEN V… (3) PROPRIÉTÉS PHYSIQUES (ÉLÉMENT… (3) Phosphure d'indium (3) Semi-conducteurs -- Matériaux (3) Semi-conducteurs à large band… (3) Arseniure (2) COMPOSÉS DU GALLIUM, DE L'IND… (2) Carbides (2) Carbone -- Propriétés électri… (2) Carbure de silicium -- Propri… (2) Diamants (2) Diamonds (2) Elektronisches Bauelement (2) GALLIUM-INDIUM-ARSEN-VERBINDU… (2) GALLLIUM-INDIUM-ARSENIC COMPO… (2) Galliumnitrid (2) Halbleiter (2) Indium -- Alliages (2) Optoelectronics (2) Optoélectronique (2) Puits quantiques (2) Quantum wells (2) Superlattices as materials (2) Superréseaux (2) siliciumcarbid (2) Amorphe (1) Amorpher Zustand ; SWD-ID: 43… (1) CADMIUM TELLURIDE (INORGANIC … (1) CADMIUMTELLURID (ANORGANISCHE… (1) CARBON (1) Cadmium compounds (1) Cadmium telluride (1) Carbon (Engineering materials) (1) Carbon -- Tecnología (1) Carbures (1) Carburo de silicón -- Propied… (1) Carbó (1) Carbón -- Propiedades eléctri… (1) Carbón -- Propiedades mecánic… (1) Carbón -- Propiedades térmicas (1) Carbón -- Propiedades ópticas (1) Ciencia de los materiales (1) Circuits intégrés à grande éc… (1) Cristalls líquids (1) Cristaux liquides -- Propriét… (1) Cristaux liquides -- Propriét… (1) Cristaux liquides -- Propriét… (1) Cristaux liquides -- Élastici… (1) DYNAMIC AND MECHANICAL PROPER… (1) DYNAMISCHE UND MECHANISCHE EI… (1) Diamant (1) Diamant -- Applications scien… (1) Diamant -- Propriétés mécaniq… (1) Diamant -- Propriétés optiques (1) Diamond (1) EIGENSCHAFTEN DÜNNER SCHICHTE… (1) ELECTRICAL AND DIELECTRICAL P… (1) ELEKTRISCHE UND DIELEKTRISCHE… (1) Eigenschaft (1) Electrical & Computer Enginee… (1) Electrical Engineering (1) Electronics (1) Electronics -- Materials (1) Electrònica -- Materials (1) Electrónica -- Materiales (1) Elektronische Eigenschaft ; S… (1) Engineering & Applied Sciences (1) FISICA -- Tabelle (1) Gallium nitride -- Electric p… (1) Gallium nitride -- Mechanical… (1) Gallium nitride -- Optical pr… (1) Gallium nitride -- Thermal pr… (1) Gallium: oorganisk kemi (1) Galliumarsenid (Halvledare) (1) Galyum arsenid yarı iletkenle… (1) Halbleitertechnologie ; SWD-I… (1) Halvledare (1) Halvledare: elektrokemi (1) Halvledare: fysik (1) Halvledarkomponenter (1) Heterostruktur (1) Indiumarsenid (1) Infrared detectors -- Materia… (1) Integrated circuits -- Large … (1) Karbider (1) Kohlenstoff ; SWD-ID: 41645388 (1) Kol (Materiallära) (1) LITHIUM METANIOBATE + LITHIUM… (1) LITHIUMMETANIOBAT + LITHIUMNI… (1) Liquid crystals displays (1) Lithium niobate (1) Lithiumniobat (1) Litio niobate (1) METANIOBATES DE LITHIUM + NIO… (1) Materiallära (1) Materials Science (1) Mercury cadmium tellurides (1) Micro-Electrical-Mechanical S… (1) Microelectromechanical systems (1) Microsystèmes électromécaniqu… (1) Mischkristall (1) Modélisation (1) Narrow gap semiconductors (1) Niobate de lithium (1) Nitrides (1) Nitrure de gallium -- Proprié… (1) Nitrure de gallium -- Proprié… (1) Nitrure de gallium -- Proprié… (1) Nitrure de gallium -- Proprié… (1) Nitrures (1) OPTICAL PROPERTIES OF MATERIA… (1) OPTISCHE MATERIALEIGENSCHAFTE… (1) PROPAGATION DES VIBRATIONS + … (1) PROPAGATION OF VIBRATIONS AND… (1) PROPERTIES OF THIN LAYERS (PH… (1) PROPRIÉTÉS DES COUCHES MINCES… (1) PROPRIÉTÉS DYNAMIQUES ET MÉCA… (1) PROPRIÉTÉS OPTIQUES DES MATÉR… (1) PROPRIÉTÉS ÉLECTRIQUES ET DIÉ… (1) Piezoelectrique (1) Plaquettes à gravure en semi-… (1) Propriete (1) RESEAU (1) SCHALLAUSBREITUNG + SCHWINGUN… (1) SEMICONDUTTORI (1) Semiconducteur (1) Semiconducteurs -- Matériaux (1) Semiconducteurs à large bande… (1) Semiconductor wafers (1) Semiconductores (1) Silicio poroso -- Propiedades… (1) Silicon carbide (1) Spectre (1) Substàncies amorfes -- Propie… (1) TELLURE DE CADMIUM (CHIMIE IN… (1) Thermodynamique (1) materiali (1) physics (1) Électronique -- Matériaux (1)

Contributor

INSPEC (Information service) (16) INSPEC (Service d'information) (11) Institution of Electrical Eng… (10) Edgar, James H. (8) Silva, S. R. P. (7) Zetterling, Carl-Mikael (6) Bhattacharya, Pallab (5) Capper, Peter (5) Stillman, G. E. (5) Wong, K. K. (5) Brozel, M. R. (4) INSPEC (4) Brozel, M. R., (Michael R.) (3) Fukuda, Atsuo (3) Nazaré, Maria Helena (3) Neves, A. J. (3) Luckhurst, G. R. (2) Pearsall, T. P. (2) Akasaki, Isamu (1) Amano, Hiroshi (1) Auberton-Herve, A. J. (1) Bhattacharya, P. (1) Bhattacharya, P. K. (1) Dunmur, D. A. (1) Dunmur, David (1) Dunmur, David A. (1) Dunmur, David, (David A.) (1) Fukuda, A. (1) Iyer, S. S. (1) Luckhurst, Geoffrey (1) Luckhurst, Geoffrey R. (1) Ravi, S. (1) Silva, S. Ravi P. (1) Stillman, Gregory E. (1) Strite, Samuel (Toby) (1) Wetzel, Christian (1)

Publisher

INSPEC (68) IEE (17)

Year

2006 (1) 2003 (10) 2002 (14) 2001 (8) 2000 (2) 1999 (9) 1996 (10) 1994 (7) 1993 (6) 1991 (1)

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