circuit reliability

Modern power electronic devices: physics, applications, and reliability

fromIET energy engineering series

0 Type: Book

The book contains 14 chapters. The following topics are dealt with: Power Electronics challenges; Junction diodes; Thyristors; Silicon MOSFETs; Silicon IGBTs; IGCTs; Silicon carbide diodes; SiC MOSFETs; GaN metal-insulator-semiconductor field-effect transistors; Gallium nitride …

As CMOS scaling moves towards the end of technology road map, a plethora of reliability issues are emerging as challenging obstacles for designing a stable/robust circuit system. Reliability issues in nano-scale designs can be broadly categorized into spatial and temporal compon…