The invention and development of advanced methods to detect light underlies much of modern technology. This fully updated and restructured third edition is unique amongst the literature, providing a comprehensive, uniform discussion of a broad range of detection approaches. The …
Proceedings, IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications (CVBVS'99): June 22, 1999, Fort Collins, Colorado
by IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications, Fort Collins, Colo.), IEEE Computer Society., Technical Committee on Pattern Analysis and Machine Intelligence
Proceedings, IEEE Workshop on Computer Vision Beyond the Visible Spectrum: methods and applications (CVBVS'99) : June 22, 19…
by IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications, Fort Collins, Colo.), IEEE Computer Society., Technical Committee on Pattern Analysis and Machine Intelligence, IEEE Xplore (Online service)
Proceedings, IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications (CVBVS'99): June 22, 1999, Fort Collins, Colorado
by IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications, Fort Collins, Colo.), IEEE Computer Society., Technical Committee on Pattern Analysis and Machine Intelligence
IEEE Workshop on Computer Vision Beyond the Visible Spectrum, Methods and Applications, June 22, 1999, Fort C…: proceedings
by IEEE Computer Society, IEEE Computer Society., Technical Committee on Pattern Analysis and Machine Intelligence, IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications
Proceedings, IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications (CVBVS'99): June 22, 1999, Fort Collins, Colorado
by IEEE Workshop on Computer Vision Beyond the Visible Spectrum: Methods and Applications, Fort Collins, Colo.), IEEE Computer Society., Technical Committee on Pattern Analysis and Machine Intelligence
Scope and Method of Study. Described is an uncooled surface-micromachined thermoelectric (TE) infrared detector that features P-doped polysilicon/Nichrome (Cr20-Ni80) as the thermocouple material pair embedded in Parylene-N, which isolates the hot junction from the substrate. Si…
