Image based measurement systems: object recognition and parameter estimation by Heijden, Ferdinand van der fromWiley series in measurement science and technology 0 Type: Book
Messtechnik: Grundlagen und Anwendungen der elektrischen Messt… by Parthier, Rainer fromStudium Technik 0 Type: Book
Physics methods in archaeometry: Varenna on Lake Como, Villa Monastero, 17-27 June… by Martini, M., Scuola Internazionale di Fisica Enrico Fermi 0 Type: Book
