Nanostructured materials -- Analysis

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High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…

"This book provides an overview of techniques for exploring materials properties on the molecular scale based on X-ray diffraction and scattering methods available at modern third-generation synchrotron radiation sources. Techniques for bulk and interface investigations of solid…

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…

"This book provides an overview of techniques for exploring materials properties on the molecular scale based on X-ray diffraction and scattering methods available at modern third-generation synchrotron radiation sources. Techniques for bulk and interface investigations of solid…

High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…

<IT>Nanoporous Materials III</IT> contains the invited lectures and peer-reviewed oral and poster contributions to be presented at the 3rd Conference on Nanoporous Materials, which will be hosted in Ottawa, Canada, June 2002. The work covers complementary approaches to and recen…