Negative bias temperature instability

In contrast to conventional bulk-silicon technology, polysilicon (poly-Si) thin-film transistors (TFTs) can be implanted in flexible substrate and can have low process temperature. These attributes make poly-Si TFT technology more attractive for new applications, such as flexibl…

The scaling trends in CMOS technology and operating conditions give rise to serious degradation mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) in MOSFETs, threatening the circuit and product lifetimes. The aging phenomena, on top …

As CMOS scaling moves towards the end of technology road map, a plethora of reliability issues are emerging as challenging obstacles for designing a stable/robust circuit system. Reliability issues in nano-scale designs can be broadly categorized into spatial and temporal compon…