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Providing an accessible introduction into the use of Total-Reflection X-ray Fluorescence (TXRF) Analysis, both from a theoretical point of view and for practical applications, this new edition of Total-Reflection X-Ray Fluorescence Analysis is completely updated and enlarged to …
This book is aimed at students and researchers who wish to use reflectance and emittance as quantitative tools to measure the properties of surfaces and materials. It is intended primarily for use in the interpretation of remote observations of the surfaces of the Earth and othe…