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Semiconductors -- Defects

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Browse all works related to Semiconductors -- Defects.

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Semiconductors -- Defects

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Point defects in semiconductors

Point defects in semiconductors

by Lannoo, Michel, Bourgoin, Jacques

fromSpringer series in solid-state sciences

0 Type: Book

Point defects in semiconductors

Point defects in semiconductors

by Bourgoin, J., (Jacques), Lannoo, M.

fromSpringer series in solid-state sciences

0 Type: Book

Point defects in semiconductors

Point defects in semiconductors

by Lannoo, M., Bourgoin, J.

0 Type: Book

Point defects in semiconductors

Point defects in semiconductors

by Lannoo, Michel, Bourgoin, Jacques

fromSpringer series in solid-state sciences

0 Type: Book

Point defects in semiconductors

Point defects in semiconductors

by Lannoo, M., (Michel), Bourgoin, J., (Jacques)

fromSpringer series in solid-state sciences

0 Type: Book

Point Defects in Semiconductors

Point Defects in Semiconductors

0 Type: Book

Point defects in semiconductors

Point defects in semiconductors: Theoretical aspects

by Lannoo, M., (Michel), Bourgoin, J., (Jacques)

fromSpringer series in solid-state sciences

0 Type: Book

Theoretical aspects

Theoretical aspects

by Lannoo, Michel, Bourgoin, Jacques

fromSpringer series in solid-state sciences

0 Type: Book

Point defects in semiconductors I

Point defects in semiconductors I: theoretical aspects

by Lannoo, Michel, Bourgoin, Jacques

fromSpringer series in solid-state sciences

0 Type: Book

Point defects in semiconductors

Point defects in semiconductors

by Bourgoin, J., (Jacques), Lannoo, M.

fromSpringer series in solid-state sciences

0 Type: Book

Point defects in semiconductors

Point defects in semiconductors

by Lannoo, M., (Michel), Bourgoin, J., (Jacques)

fromSpringer series in solid-state sciences

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo, Hikita, Harumi, Ogihara, Chisato

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo, Hikita, Harumi, Ogihara, Chisato

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo, Hikita, Harumi, Ogihara, Chisato

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo, Hikita, Harumi, Ogihara, Chisato

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo, CRC Press

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo, Hikita, Harumi, Ogihara, Chisato

0 Type: Book

Light-induced defects in semiconductors

Light-induced defects in semiconductors

by Morigaki, Kazuo, Hikita, Harumi, Ogihara, Chisato

0 Type: Book

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Subjects

Semiconductors -- Defects (62) Semi-conducteurs -- Défauts (31) Electronic apparatus and appl… (28) Electronic apparatus and appl… (28) Electronics -- Materials (28) Microelectronics -- Handbooks… (28) Microelectronics -- Materials (28) Semiconductors -- Handbooks, … (28) Electronics -- Handbooks, man… (27) Appareils électroniques -- Gu… (24) Semi-conducteurs -- Guides, m… (24) Microélectronique -- Guides, … (23) Point defects (11) Défauts ponctuels (10) Semiconductors -- Effect of r… (3) Cristallographie mathématique (2) Crystallography, Mathematical (2) Halbleiter (2) Halvledare: fysik (2) Kristalldefekter (2) Light (2) Lumière (2) Microélectronique -- Guides, … (2) Semi-conducteurs -- Analyse (2) Semi-conducteurs -- Effets du… (2) Semi-conducteurs -- Fiabilité (2) Semiconductors (2) Semiconductors -- Analysis (2) Semiconductors -- Reliability (2) light (energy) (2) (Produktform)Electronic book … (1) (VLB-Produktgruppen)TN000 (1) (VLB-WN)9650: Nonbooks, PBS /… (1) Appareils électroniques - Ess… (1) CIRCUITS DE SEMI-CONCUDCTEUR … (1) COMPLEMENTARY-METAL-OXIDE-SEM… (1) Cristaux (1) Cristaux -- Défauts (1) Crystals (1) DEFECT RECOGNITION + FAULT RE… (1) DEFEKTERKENNUNG + FEHLERERKEN… (1) DEFORMATION (1) Dehnung (1) DÉFAUT INTERNE (ESSAIS DES MA… (1) DÉPANNAGE + RECHERCHE DE PANN… (1) Electronic apparatus and appl… (1) Electronics - Materials - Tes… (1) FACHLICHE NACHSCHLAGEWERKE + … (1) Festkörperphysik (1) Gitterbaufehler (1) Group theory (1) Gruppentheorie (1) Guides et manuels (1) HALBLEITERBAUELEMENTE + ELEKT… (1) HALBLEITERMATERIALIEN (ELEKTR… (1) Handbooks and manuals (1) HÖCHSTINTEGRIERTE SCHALTUNGEN… (1) INNERE MATERIALFEHLER (MATERI… (1) INTERNAL DEFECTS (MATERIALS T… (1) INTÉGRATION À TRÈS GRANDE ÉCH… (1) Ion implantation (1) Ions -- Implantation (1) KOMPLEMENTÄRE METALLOXID-HALB… (1) Kristall (1) Kristallsymmetrie (1) MATÉRIAUX SEMICONDUCTEURS (ÉL… (1) MEASUREMENT METHODS/ELECTRICA… (1) MESSVERFAHREN/ELEKTROTECHNIK (1) MICROELECTRONICS + INTEGRATED… (1) MICROÉLECTRONIQUE + CIRCUITS … (1) MIKROELEKTRONIK + INTEGRIERTE… (1) Magnetic resonance (1) Mechanische Spannung (1) Microelectronics - Materials … (1) Microelectronics - Materials … (1) Microélectronique - Défauts -… (1) Nanophysik (1) Nanostruktur (1) OUVRAGES DE RÉFÉRENCE SPÉCIAL… (1) PROCÉDÉS DE MESURE/ÉLECTROTEC… (1) RECOMBINATION + RECOMBINATION… (1) REKOMBINATION + REKOMBINATION… (1) RÉCOMBINAISON + ÉFFETS DE RÉC… (1) Résonance magnétique (1) SCIENCE -- Physics (1) SEMICONDUCTOR COMPONENTS + EL… (1) SEMICONDUCTOR MATERIALS (ELEC… (1) SPECIALIZED REFERENCE WORKS +… (1) Semi-conducteurs (1) Semi-conducteurs - Défauts - … (1) Semi-conducteurs -- Dopage (1) Semiconducteurs (1) Semiconducteurs -- Défauts (1) Semiconductor doping (1) Semiconductores (1) Silicium (1) Silicon (1) TECHNOLOGY & ENGINEERING -- E… (1) TECHNOLOGY & ENGINEERING -- M… (1) Théorie des groupes (1) VERY LARGE SCALE INTEGRATED C… (1) crystal (material by form) (1) defects in crystals (1) semiconductor (1) ÉLEMENTS SEMI-CONDUCTEURS + C… (1)

Contributor

Electronic Device Failure Ana… (13) Morigaki, Kazuo (10) Ross, Richard J. (10) Hikita, Harumi (8) Ogihara, Chisato (8) Bourgoin, J., (Jacques) (5) ASM International (4) Bourgoin, Jacques (4) Lannoo, M. (4) Lannoo, Michel (4) Bir, Gennadiĭ Levikovich (3) Lannoo, M., (Michel) (3) Pikus, Grigoriĭ Ezekielevich (3) Louvish, David (2) ProQuest (Firm) (2) ebrary, Inc (2) Bourgoin, J. (1) CRC Press (1) Electronic Device Failure Ana… (1) Hanbücken, Margrit (1) Hensel, J. C. (1) Kane, Terry (1) Müller, Pierre (1) Romano, Luciano (1) Romano, Lúcia (1) Shelnitz, Pesach (1) Wehrspohn, Ralf B. (1)

Publisher

ASM International (26) Pan Stanford Publishing (6) Springer-Verlag (5) Springer (3) CRC Press (2) Israel program for scientific… (2) Pan Stanford Publishing Pte L… (2) Springer-Vlg (2) The Institution of Engineerin… (2) Wiley (2) Wiley-VCH (2) A S M International (1) Academic Press is an imprint … (1) Books24x7.com (1) Distributed by Wiley (1) Elsevier (1) Elsevier Academic Press (1) Elsevier/AP, Acad. Press (1) Elsevier/Academic Press (1) John Wiley & Sons (1) Pan Standard Publishing Pte L… (1) Spriger-Verlag (1)

Year

2020 (1) 2019 (5) 2015 (15) 2013 (1) 2011 (12) 2010 (1) 2004 (3) 2001 (10) 1983 (2) 1981 (6) 1974 (2)

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