Guide to mitigating spacecraft charging effects by Garrett, Henry B., Whittlesey, Albert C. fromJPL space science and technology series 0 Type: Book
ISTFA '96: proceedings of the 22nd International Symposium f… by ISTFA (International Symposium for Testing and Failure Analysis), ASM International 0 Type: Book
Proceedings of the 25th International Symposium for Testing and Failure Analysis by Electronic Device Failure Analysis Society, ISTFA (International Symposium for Testing and Failure Analysis), (Santa Clara (CA)) 0 Type: Book
On-chip ESD protection for integrated circuits: an IC design perspective by Wang, Albert Z. H. fromKluwer international series in engineering and computer sci… 0 Type: Book
