High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…
High resolution X-ray diffraction and scattering is a key tool for structure analysis not only in materials but also at surfaces and buried interfaces from the sub-nanometre range to micrometers. This book looks at new developments in the field.
"This book provides an overview of techniques for exploring materials properties on the molecular scale based on X-ray diffraction and scattering methods available at modern third-generation synchrotron radiation sources. Techniques for bulk and interface investigations of solid…
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…
1. Overview of x-ray scattering and diffraction theory and techniques / Oliver H. Seeck -- 2. Scattering and diffraction beamlines at synchrotron radiation sources / Oliver H. Seeck -- 3. Micro- and nanodiffraction / Christina Krywka and Martin Muller -- 4. Small-angle x-ray sca…
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…
"This book provides an overview of techniques for exploring materials properties on the molecular scale based on X-ray diffraction and scattering methods available at modern third-generation synchrotron radiation sources. Techniques for bulk and interface investigations of solid…
High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently a…
The first stage in the determination of a crystal structure is the measurement of the intensities of the Bragg reflexions. This book is concerned with counter-methods of measuring these intensities. The use of counter methods has spread rapidly in recent years with the developme…
The first stage in the determination of a crystal structure is the measurement of the intensities of the Bragg reflexions. This book is concerned with counter-methods of measuring these intensities. The use of counter methods has spread rapidly in recent years with the developme…
"Although the book has been written from the perspective of two physicists, we hope that it will be useful to the wider community of biologists, chemists, material scientists, etc., who work at synchrotron radiation facilities around the world"--
