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In order to enhance performance and to support highly integrated functions, on-chip memory area has increased every technology generation. However, increased effect of parametric variations, susceptibility to soft errors, and increased leakage current in scaled technologies pose…

Field Programmable Gate Arrays (FPGAs) are programmable logic devices that can be used to implement a given digital design. Built-In Self-Test (BIST) is a testing technique that enables the device to test itself without the need for any external test equipment. The re-programmab…