Electronics reliability and measurement technology

Electronics reliability and measurement technology: nondestructive evaluation

by Heyman, Joseph S.

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Title Statements

  • Full title :Electronics reliability and measurement technology : nondestructive evaluation / edited by Joseph S. Heyman

Edition Statements

  • Publication Date:1988

Publication Statements

  • Publisher(s):Noyes Data Corp
  • Place of Publication:Park Ridge, NJ
  • Language:eng
  • Publication Date:1988

Notes

"The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--Page vii

The Physical Object

  • Description:XII, 128 Seiten : Illustrationen : 27 cm

Edition Identifiers

  • ISBN:081551171X, 9780815511717
  • oclc:ocn831380907
  • LC Classification:TK7874
  • Dewey Decimal:621.3810287

Subjects

Integrated circuits nondestructive testing

Writers

Heyman, Joseph S.

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